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US Patent 7791724 Characterization of transmission losses in an optical system
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Patent
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Date Filed
June 13, 2006
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Date of Patent
September 7, 2010
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Patent Application Number
11451599
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Patent Citations Received
US Patent 12117734 Metrology method and device for determining a complex-valued field
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US Patent 11754906 Hollow-core photonic crystal fiber based optical component for broadband radiation generation
US Patent 11940739 Metrology apparatus
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Patent Inventor Names
Wilhelmus Maria Corbeij
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Markus Gerardus Martinus Van Kraaij
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Mircea Dusa
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Arie Jeffrey Den Boef
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
7791724
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Patent Primary Examiner
Tarifur Chowdhury
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