Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Erich Kolmhofer0
Date of Patent
September 14, 2010
0Patent Application Number
120202510
Date Filed
January 25, 2008
0Patent Primary Examiner
Patent abstract
A probe device for testing a semiconductor chip includes a substrate and a balun formed on the substrate. The balun includes first and second differential ports and a single-ended port. The probe device includes first and second probe tips respectively coupled to the first and second differential ports.
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