US Patent 7795889 Probe device
Patent 7795889 was granted and assigned to Infineon Technologies on September, 2010 by the United States Patent and Trademark Office.
All edits
Edits on 31 Oct, 2023
Golden AI
Edits made to:
Article (+319 characters)
Article
Patent abstract
A probe device for testing a semiconductor chip includes a substrate and a balun formed on the substrate. The balun includes first and second differential ports and a single-ended port. The probe device includes first and second probe tips respectively coupled to the first and second differential ports.
Edits on 18 Sep, 2023
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Inventor Names
Erich Kolmhofer0
Edits on 21 May, 2023
Golden AI
Edits made to:
Infobox (+1/-1 properties)
US Patent 07795889 Probe device US Patent 7795889 Probe device
Infobox
Patent Number
077958890
Patent Number
77958890
Edits on 20 May, 2023
Golden AI
Edits made to:
Infobox (-1 properties)
Infobox
Official Website
Edits on 21 Mar, 2023
Golden AI
Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
077958890
Date of Patent
September 14, 2010
0Patent Application Number
120202510
Date Filed
January 25, 2008
0Official Website
Patent Primary Examiner
Edits on 3 Jun, 2022
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Website URL
Edits on 5 Dec, 2021
Golden AI
Edits made to:
Infobox (+8 properties)
US Patent 07795889 Probe device
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07795889
Date of patent
September 14, 2010
Patent application number
12020251
Date Filed
January 25, 2008
Patent primary examiner
Find more entities like US Patent 7795889 Probe device
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
