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US Patent 7804313 Semiconductor device

Patent 7804313 was granted and assigned to Seiko Instruments on September, 2010 by the United States Patent and Trademark Office.

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Patent abstract

Provided is a semiconductor device, in which: patterns for detecting displacement at probing are formed of a plurality of minute conductors formed below a protective film; each of the plurality of minute conductors formed below the protective film is electrically insulated and formed to be smaller than a bottom surface of a tip of a probing needle used for carrying out an electrical measurement of IC chips; and the patterns for detecting displacement at probing are provided in a pair for each of the IC chips.

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Patent Inventor Names
Hiroaki Takasu0
Sukehiro Yamamoto0
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US Patent 07804313 Semiconductor device US Patent 7804313 Semiconductor device

Infobox
Patent Number
078043130
Patent Number
78043130
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=078043130
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Infobox
Is a
Patent
Patent
0
Current Assignee
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Seiko Instruments
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
078043130
Date of Patent
September 28, 2010
0
Patent Application Number
123544230
Date Filed
January 15, 2009
0
Official Website
https://pdfpiw.uspto.gov/.piw?Docid=078043130
Patent Primary Examiner
‌
Ha Tran T Nguyen
0
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=07804313
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 US Patent 07804313 Semiconductor device

Infobox
Is a
Patent
Patent
Current assignee
‌
Seiko Instruments
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
07804313
Date of patent
September 28, 2010
Patent application number
12354423
Date Filed
January 15, 2009
Patent primary examiner
‌
Ha Tran T Nguyen

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