Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
November 2, 2010
Patent Application Number
12418843
Date Filed
April 6, 2009
Patent Citations Received
Patent Primary Examiner
Patent abstract
A system for testing and a method for making a semiconductor device is disclosed. A preferred embodiment includes a conductor overlying a dielectric layer. The conductor is coupled to a first test pad via a first conducting line and to a second test pad via a second conducting line.
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