US Patent 7847566 Configurable prober for TFT LCD array test

Patent 7847566 was granted and assigned to Applied Materials on December, 2010 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Current Assignee

Applied Materials

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

7847566

Date of Patent

December 7, 2010

Patent Application Number

11940432

Date Filed

November 15, 2007

Patent Primary Examiner

‌

Minh N. Tang

Patent abstract

A method of testing electronic devices on substrates is described. The method includes placing a configurable prober over a first substrate, testing the first substrate, re-configuring the configurable prober, placing the configurable prober over a second substrate, and testing the second substrate.

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