US Patent 7847566 Configurable prober for TFT LCD array test
Patent 7847566 was granted and assigned to Applied Materials on December, 2010 by the United States Patent and Trademark Office.
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Patent abstract
A method of testing electronic devices on substrates is described. The method includes placing a configurable prober over a first substrate, testing the first substrate, re-configuring the configurable prober, placing the configurable prober over a second substrate, and testing the second substrate.
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US Patent 07847566 Configurable prober for TFT LCD array test US Patent 7847566 Configurable prober for TFT LCD array test
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Patent Number
0784756600
Patent Number
784756600
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Official Website
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
078475660
Date of Patent
December 7, 2010
0Patent Application Number
119404320
Date Filed
November 15, 2007
0Official Website
Patent Primary Examiner
Edits on 23 Sep, 2022
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
078475660
Date of Patent
December 7, 2010
0Patent Application Number
119404320
Date Filed
November 15, 2007
0Official Website
Patent Primary Examiner
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US Patent 07847566 Configurable prober for TFT LCD array test
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07847566
Date of patent
December 7, 2010
Patent application number
11940432
Date Filed
November 15, 2007
Patent primary examiner
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