Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Emil Gizdarski0
Samitha Samaranayake0
Suryanarayana Duggirala0
Thomas W. Williams0
Frederic J. Neuveux0
Nodari Sitchinava0
Rohit Kapur0
Date of Patent
March 1, 2011
0Patent Application Number
127790180
Date Filed
May 12, 2010
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.
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