US Patent 7900105 Dynamically reconfigurable shared scan-in test architecture
Patent 7900105 was granted and assigned to Synopsys on March, 2011 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
May 12, 2010
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Date of Patent
March 1, 2011
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Patent Application Number
12779018
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Patent Citations Received
Patent Inventor Names
Emil Gizdarski
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Samitha Samaranayake
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Suryanarayana Duggirala
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Thomas W. Williams
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Frederic J. Neuveux
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Nodari Sitchinava
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Rohit Kapur
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Patent Jurisdiction
Patent Number
Patent Primary Examiner
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