Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Sandeep Bhatia0
Date of Patent
April 12, 2011
0Patent Application Number
125499510
Date Filed
August 28, 2009
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A scan technique using linear matrix to drive scan chains is used, along with an ATPG, to constraint scan test vectors to be generated through the linear matrix. The linear matrix scan technique reduces the test application time and the amount of test vector data by several orders of magnitude over conventional techniques, without reducing fault coverage.
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