Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Robert Bailey0
Zaifu Zhang0
Date of Patent
May 10, 2011
0Patent Application Number
113696480
Date Filed
March 7, 2006
0Patent Citations Received
0
Patent Primary Examiner
Patent abstract
A method and system for testing an electronic device is disclosed. The method includes loading a first test into a test pattern generator of a first device and generating a first test pattern at the test pattern generator. A second test seed is loaded into the test pattern generator while the first test pattern is being generated. In one embodiment, the state of the test pattern generator is modified based upon the second test seed, and the first test seed.
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