US Patent 7941718 Electronic device testing system
Patent 7941718 was granted and assigned to Freescale Semiconductor on May, 2011 by the United States Patent and Trademark Office.
All edits
Edits on 16 Oct, 2024
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
Edits on 14 Aug, 2024
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
Edits on 7 Aug, 2024
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
0
Edits on 4 Apr, 2024
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
Edits on 29 Mar, 2024
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
Edits on 14 Mar, 2024
Golden AI
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
Edits on 27 Nov, 2023
Golden AI
Edits made to:
Article (+476 characters)
Article
Patent abstract
A method and system for testing an electronic device is disclosed. The method includes loading a first test into a test pattern generator of a first device and generating a first test pattern at the test pattern generator. A second test seed is loaded into the test pattern generator while the first test pattern is being generated. In one embodiment, the state of the test pattern generator is modified based upon the second test seed, and the first test seed.
Edits on 19 Sep, 2023
Golden AI
Edits made to:
Infobox (+2 properties)
Infobox
Patent Inventor Names
Robert Bailey0
Zaifu Zhang0
Edits on 19 May, 2023
Golden AI
Edits made to:
Infobox (+1/-1 properties)
US Patent 07941718 Electronic device testing system US Patent 7941718 Electronic device testing system
Infobox
Patent Number
079417180
Patent Number
79417180
Edits on 28 Apr, 2023
Golden AI
Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
079417180
Date of Patent
May 10, 2011
0Patent Application Number
113696480
Date Filed
March 7, 2006
0Patent Primary Examiner
Edits on 7 Dec, 2021
Golden AI
Edits made to:
Infobox (+8 properties)
US Patent 07941718 Electronic device testing system
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07941718
Date of patent
May 10, 2011
Patent application number
11369648
Date Filed
March 7, 2006
Patent primary examiner
Find more entities like US Patent 7941718 Electronic device testing system
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
