US Patent 7956337 Scribe process monitoring methodology
Patent 7956337 was granted and assigned to Applied Materials on June, 2011 by the United States Patent and Trademark Office.
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One embodiment of the present invention sets forth a computer-implemented method for tuning laser scribe parameters during the fabrication of a solar module. The method includes analyzing the visual appearance of a laser scribe to extract various morphological parameters related to the quality of a laser scribe process used to produce the scribe. Based on the morphological parameters, the laser scribe parameters may be modified in-situ to achieve settings that are optimal for performing laser scribing in each layer of the solar module. As a result, laser scribe process cycle time may be minimized while providing better indication of the laser scribe process stability and quality relative to the prior art approaches.
US Patent 07956337 Scribe process monitoring methodology US Patent 7956337 Scribe process monitoring methodology
US Patent 07956337 Scribe process monitoring methodology
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