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US Patent 8001516 Characterization and reduction of variation for integrated circuits

Patent 8001516 was granted and assigned to Cadence Design Systems on August, 2011 by the United States Patent and Trademark Office.

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Patent Citations Received
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US Patent 12106034 Rule check violation prediction systems and methods
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Patent Citations Received
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US Patent 11861287 Integrated circuit development using density-aware border fill
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Patent abstract

A method and system are described to reduce process variation as a result of the semiconductor processing of films in integrated circuit manufacturing processes. The described methods use process variation and electrical impact to modify the design and manufacture of integrated circuits.

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Patent Inventor Names
David White0
Taber H. Smith0
Vikas Mehrotra0
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US Patent 08001516 Characterization and reduction of variation for integrated circuits US Patent 8001516 Characterization and reduction of variation for integrated circuits

Infobox
Patent Number
080015160
Patent Number
80015160
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Infobox
Is a
Patent
Patent
0
Current Assignee
Cadence Design Systems
Cadence Design Systems
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
080015160
Date of Patent
August 16, 2011
0
Patent Application Number
121318330
Date Filed
June 2, 2008
0
Patent Primary Examiner
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Stacy A. Whitmore
0
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 US Patent 08001516 Characterization and reduction of variation for integrated circuits

Infobox
Is a
Patent
Patent
Current assignee
Cadence Design Systems
Cadence Design Systems
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
08001516
Date of patent
August 16, 2011
Patent application number
12131833
Date Filed
June 2, 2008
Patent primary examiner
‌
Stacy A. Whitmore

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