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US Patent 8010310 Method and apparatus for identifying outliers following burn-in testing

Patent 8010310 was granted and assigned to Advanced Micro Devices on August, 2011 by the United States Patent and Trademark Office.

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Patent abstract

A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is identified as an outlier device based on the comparison.

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