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US Patent 8092703 Manufacturing method of semiconductor device
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Patent
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Date Filed
June 12, 2007
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Date of Patent
January 10, 2012
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Patent Application Number
11808650
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Patent Citations Received
US Patent 11988961 Radiation based patterning methods
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US Patent 11693312 Radiation based patterning methods
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US Patent 11754924 Organotin oxide hydroxide patterning compositions, precursors, and patterning
US Patent 11966159 Organometallic solution based high resolution patterning compositions
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US Patent 11988958 Organometallic solution based high resolution patterning compositions
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US Patent 11988960 Organometallic solution based high resolution patterning compositions
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US Patent 11988959 Organometallic solution based high resolution patterning compositions and corresponding methods
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Patent Inventor Names
Kazunori Yoshikawa
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Takeo Ishibashi
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Yoshiharu Ono
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Kazumasa Yonekura
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Masahiro Tadokoro
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
8092703
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Patent Primary Examiner
Nadine G. Norton
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