US Patent 8250420 Testable integrated circuit and test data generation method
Is a
Date Filed
April 3, 2008
0
Date of Patent
August 21, 2012
0
Patent Application Number
12594594
0
Patent Citations Received
Patent Inventor Names
Friedrich Hapke
0
Juergen Schloeffel
0
Michael Wittke
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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