Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Sandeep Jain
Shalini Pathak
Date of Patent
October 10, 2023
Patent Application Number
17747331
Date Filed
May 18, 2022
Patent Citations
...
Patent Primary Examiner
Patent abstract
A method for testing a chip comprising: receiving N scan-in chains of test data; using the N scan-in chains of test data to perform tests on the chip; receiving a merged expected test-result and masking-instruction signal on X pins of the chip from the off-chip test equipment, X being less than 2*N; decoding the merged expected test-result and masking-instruction signal to extract N decoded output signals, each of the N decoded output signals corresponding to a respective chain of test results.
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