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US Patent 11782092 Scan compression through pin data encoding

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Date Filed
May 18, 2022
Date of Patent
October 10, 2023
Patent Application Number
17747331
Patent Citations
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US Patent 10591540 Compressed scan chains with three input mask gates and registers
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US Patent 9355203 Shared channel masks in on-product test compression system
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US Patent 9766289 LBIST debug controller
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US Patent 7412672 Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit
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US Patent 7673208 Storing multicore chip test data
‌
US Patent 7689884 Multicore chip test
‌
US Patent 7913137 On-chip comparison and response collection tools and techniques
‌
US Patent 8250420 Testable integrated circuit and test data generation method
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US Patent 8418007 On-chip comparison and response collection tools and techniques
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US Patent 8914694 On-chip comparison and response collection tools and techniques
•••
Patent Inventor Names
Sandeep Jain
Shalini Pathak
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11782092
Patent Primary Examiner
‌
John J Tabone, Jr.
CPC Code
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G01R 31/318555
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G01R 31/318558
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G01R 31/317
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G01R 31/31853
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G01R 31/318536
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G01R 31/318566
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G01R 31/318533

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