Create
Log in
Sign up
Golden has been acquired by ComplyAdvantage.
Read about it here ⟶
US Patent 8299935 Test apparatus and test method
Overview
Structured Data
Issues
Contributors
Activity
Access by API
Access by API
Is a
Patent
Date Filed
August 16, 2010
Date of Patent
October 30, 2012
Patent Application Number
12857488
Patent Citations Received
US Patent 12117485 Wafer inspection system
0
US Patent 11860221 Apparatus for testing electronic devices
0
US Patent 11977098 System for testing an integrated circuit of a device and its method of use
0
US Patent 12007451 Method and system for thermal control of devices in an electronics tester
0
US Patent 11762012 Wafer inspection system
US Patent 11835575 Electronics tester
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
8299935
Patent Primary Examiner
Toan N Pham
Find more entities like US Patent 8299935 Test apparatus and test method
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Company
Home
Press & Media
Blog
Careers
WE'RE HIRING
Products
Knowledge Graph
Query Tool
Data Requests
Knowledge Storage
API
Pricing
Enterprise
ChatGPT Plugin
Legal
Terms of Service
Enterprise Terms of Service
Privacy Policy
Help
Help center
API Documentation
Contact Us
SUBSCRIBE