US Patent 8351048 Linear-carrier phase-mask interferometer
Patent 8351048 was granted and assigned to 4D Technology Corporation on January, 2013 by the United States Patent and Trademark Office.
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Patent abstract
A phase-difference sensor measures the spatially resolved difference in phase between orthogonally polarized reference and test wavefronts. The sensor is constructed as a linear-carrier phase-mask aligned to and imaged on a linear-carrier detector array. Mireau and Fizeau polarization interferometric objectives are implemented with a thin conductive wire grid optically coupled to the objective beam splitter.
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US Patent 08351048 Linear-carrier phase-mask interferometer US Patent 8351048 Linear-carrier phase-mask interferometer
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Patent Number
0835104800
Patent Number
835104800
Edits on 24 Mar, 2023
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
083510480
Date of Patent
January 8, 2013
0Patent Application Number
128567230
Date Filed
August 16, 2010
0Patent Primary Examiner
Edits on 24 Sep, 2022
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Infobox
Is a
Current Assignee
Patent Jurisdiction
Patent Number
083510480
Date of Patent
January 8, 2013
0Patent Application Number
128567230
Date Filed
August 16, 2010
0Patent Primary Examiner
Edits on 15 Dec, 2021
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US Patent 08351048 Linear-carrier phase-mask interferometer
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
08351048
Date of patent
January 8, 2013
Patent application number
12856723
Date Filed
August 16, 2010
Patent primary examiner
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