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US Patent 8443459 Fast-scanning SPM scanner and method of operating same

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Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
84434590
Patent Inventor Names
Craig Cusworth0
Craig Prater0
Nghi Phan0
Date of Patent
May 14, 2013
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Patent Application Number
134350860
Date Filed
March 30, 2012
0
Patent Citations Received
‌
US Patent RE49997 Metrological scanning probe microscope
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Patent Primary Examiner
‌
Jack Berman
0
Patent abstract

A high-bandwidth SPM tip scanner includes an objective that is vertically movable within the scan head to increase the depth of focus for the sensing light beam. Movable optics also are preferably provided to permit targeting of the sensing light beam on the SPM's probe and to permit the sensing light beam to track the probe during scanning. The targeting and tracking permit the impingement of a small sensing light beam spot on the probe under direct visual inspection of focused illumination beam of an optical microscope integrated into the SPM and, as a result, permits the use of a relatively small cantilever with a commensurately small resonant frequency. Images can be scanned on large samples having a largest dimension exceeding 7 mm with a resolution of less than 1 Angstrom and while scanning at rates exceeding 30 Hz.

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