US Patent 8744166 System and method for multiple simultaneous automated defect detection

A system and method for performing automated defect detection using multiple image capture devices is disclosed. The system and method may include providing a plurality of image capture devices, the plurality of image capture devices capturing and transmitting a plurality of images of an object. The system and method may further include determining a feature correspondence between the plurality of images of the plurality of image capture devices, creating mosaiced images of the plurality of images if the feature correspondence is found or known and performing at least of an automated analysis and a manual inspection on the mosaiced images to find any defects in the object.