US Patent 8781755 Fugitive emission flux measurement

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Is a

Patent

Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

87817550

Patent Inventor Names

Colin Irvin Wong0

Date of Patent

July 15, 2014

Patent Application Number

129641490

Date Filed

December 9, 2010

Patent Citations Received

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US Patent 12066353 Apparatuses and methods for gas flux measurements

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US Patent 11656075 High-sensitivity gas-mapping 3D imager and method of operation

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US Patent 11692900 Apparatuses and methods for anomalous gas concentration detection

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US Patent 11761590 Technologies for producing efficient investigation routes for identifying gas leak locations

‌

US Patent 11921211 Apparatuses and methods for a rotating optical reflector

Patent Primary Examiner

‌

Michael Nghiem

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