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US Patent 8781755 Fugitive emission flux measurement

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Date Filed
December 9, 2010
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Date of Patent
July 15, 2014
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Patent Application Number
12964149
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Patent Citations Received
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US Patent 12066353 Apparatuses and methods for gas flux measurements
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US Patent 11656075 High-sensitivity gas-mapping 3D imager and method of operation
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US Patent 11692900 Apparatuses and methods for anomalous gas concentration detection
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US Patent 11761590 Technologies for producing efficient investigation routes for identifying gas leak locations
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US Patent 11921211 Apparatuses and methods for a rotating optical reflector
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Patent Inventor Names
Colin Irvin Wong
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
8781755
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Patent Primary Examiner
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Michael Nghiem
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