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US Patent 8791549 Wafer backside interconnect structure connected to TSVs
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Patent
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Date Filed
July 7, 2010
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Date of Patent
July 29, 2014
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Patent Application Number
12832019
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Patent Citations Received
US Patent 12119318 Bonding structure and method of forming same
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US Patent 11664336 Bonding structure and method of forming same
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US Patent 11843020 Image sensor
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US Patent 12080628 Micro through-silicon via for transistor density scaling
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US Patent 12112997 Micro through-silicon via for transistor density scaling
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Patent Inventor Names
Shau-Lin Shue
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Wen-Chih Chiou
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Ming-Fa Chen
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
8791549
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Patent Primary Examiner
Hoang-Quan Ho
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