US Patent 8875077 Fault sensitivity analysis-based cell-aware automated test pattern generation flow

Patent 8875077 was granted and assigned to Cadence Design Systems on October, 2014 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors Activity

Is a

Patent

Patent attributes

Patent Applicant

Cadence Design Systems

Current Assignee

Cadence Design Systems

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

8875077

Date of Patent

October 28, 2014

Patent Application Number

14176921

Date Filed

February 10, 2014

Patent Citations Received

‌

US Patent 11892501 Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patterns

‌

US Patent 11869612 Device aware test for memory units

Patent Primary Examiner

‌

Suresh Memula

No article content yet.

Timeline

No Timeline data yet.

Further Resources

Title

Author

Link

Type

Date

No Further Resources data yet.

References

Find more entities like US Patent 8875077 Fault sensitivity analysis-based cell-aware automated test pattern generation flow

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.

Open Query Tool

Access by API