Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Kohei Terada0
Date of Patent
March 24, 2015
0Patent Application Number
142206570
Date Filed
March 20, 2014
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A pattern inspection apparatus is provided, including a reading mechanism configured to read a print pattern including an overlapped pattern portion formed by overlapping a first-pattern and a second-pattern and a single pattern portion formed with only any one of the first-pattern and the second-pattern; and a controller configured to perform acquisition of density information of the print pattern based on a result of the reading and correction of density information of the overlapped pattern portion by using density information of the single pattern portion.
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