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US Patent 9069081 Radiation monitoring device
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Patent
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Date Filed
August 11, 2008
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Date of Patent
June 30, 2015
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Patent Application Number
12672758
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Patent Citations Received
US Patent 12080514 Arbitrary electron dose waveforms for electron microscopy
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Patent Inventor Names
Winnie Sze-Wing Wong
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Xavier Llopart Cudie
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Ernst Fritsch
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Gisela Anton
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Karl L. Schwartz
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Lukas Tlustos
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Michael Böhnel
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Michael Campbell
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Rafael Ballabriga Suñe
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Thilo Michel
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•••
Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
9069081
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Patent Primary Examiner
David Porta
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