Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Wei-Yang Lee0
Ting-Yeh Chen0
Date of Patent
March 15, 2016
0Patent Application Number
145614720
Date Filed
December 5, 2014
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A method for manufacturing a FinFET, and FinFETs are provided. In various embodiments, the method for manufacturing a FinFET includes forming a fin structure over a substrate. Next, a dummy gate is deposited across over the fin structure. The method continues with forming a pair of first spacers on sidewalls of the dummy gate. Then, a source/drain region is formed in the fin structure not covered by the dummy gate. The method further includes removing the dummy gate to expose the fin structure. After that, the first spacers are truncated, and a gate stack is formed to cover the exposed fin structure and top surfaces of the first spacers.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.