Is a
Patent attributes
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Christopher Schuermyer0
Wu-Tung Cheng0
Robert Brady Benware0
Chen-Yi Chang0
Jonathan J Muirhead0
Date of Patent
September 13, 2016
0Patent Application Number
139739980
Date Filed
August 22, 2013
0Patent Citations Received
Patent Primary Examiner
Patent abstract
Aspects of the invention relate to yield analysis techniques for generating root cause candidates for yield analysis. With various implementations of the invention, points of interest are first identified in a layout design. Next, regions of interest are determined for the identified points of interest. Next, one or more properties are extracted from the regions of interest. Based at least on the one or more properties, diagnosis reports of failing devices fabricated according to the layout design are analyzed to identify probable root causes.
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