US Patent 9443051 Generating root cause candidates for yield analysis
Patent 9443051 was granted and assigned to Mentor Graphics on September, 2016 by the United States Patent and Trademark Office.
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Patent abstract
Aspects of the invention relate to yield analysis techniques for generating root cause candidates for yield analysis. With various implementations of the invention, points of interest are first identified in a layout design. Next, regions of interest are determined for the identified points of interest. Next, one or more properties are extracted from the regions of interest. Based at least on the one or more properties, diagnosis reports of failing devices fabricated according to the layout design are analyzed to identify probable root causes.
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Patent Inventor Names
Chen-Yi Chang0
Christopher Schuermyer0
Jonathan J Muirhead0
Robert Brady Benware0
Wu-Tung Cheng0
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Official Website
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US Patent 09443051 Generating root cause candidates for yield analysis US Patent 9443051 Generating root cause candidates for yield analysis
Infobox
Patent Number
094430510
Patent Number
94430510
Edits on 25 Sep, 2022
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Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
094430510
Date of Patent
September 13, 2016
0Patent Application Number
139739980
Date Filed
August 22, 2013
0Official Website
Patent Primary Examiner
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US Patent 09443051 Generating root cause candidates for yield analysis
Infobox
Is a
Patent applicant
Current assignee
Patent jurisdiction
Patent number
09443051
Date of patent
September 13, 2016
Patent application number
13973998
Date Filed
August 22, 2013
Patent primary examiner
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