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US Patent 9508829 Nanosheet MOSFET with full-height air-gap spacer
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Patent
Date Filed
May 4, 2016
Date of Patent
November 29, 2016
Patent Application Number
15146031
Patent Citations Received
US Patent 12094972 Gate-all-around field effect transistors having end portions of nanosheet channel layers adjacent to source/drain regions being wider than the center portions
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US Patent 11664422 Nanosheet transistor with ultra low-k spacer and improved patterning robustness
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US Patent 11756996 Formation of wrap-around-contact for gate-all-around nanosheet FET
US Patent 11756837 Hybrid nanosheet tunnel-FET/CMOS technology
Patent Inventor Names
Kangguo Cheng
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Bruce B. Doris
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Xin Miao
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Michael A. Guillorn
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
9508829
Patent Primary Examiner
Allan R. Wilson
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