Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Wen-Chun Huang0
Ming-Hui Chih0
Ru-Gun Liu0
Wen-Li Cheng0
Date of Patent
June 13, 2017
0Patent Application Number
148319260
Date Filed
August 21, 2015
0Patent Citations Received
0
Patent Primary Examiner
Patent abstract
The present disclosure provides a method of performing optical proximity correction (OPC). An integrated circuit (IC) design layout is received. The design layout contains a plurality of IC layout patterns. Two or more of the plurality of IC layout patterns are grouped together. The grouped IC layout patterns are dissected, or target points are set for the grouped IC layout patterns. Thereafter, an OPC process is performed based on the grouped IC layout patterns.
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