Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
January 2, 2018
Patent Application Number
14149505
Date Filed
January 7, 2014
Patent Citations Received
Patent Primary Examiner
Patent abstract
A system and method for forming photoresists over semiconductor substrates is provided. An embodiment comprises a photoresist with a concentration gradient. The concentration gradient may be formed by using a series of dry film photoresists, wherein each separate dry film photoresist has a different concentration. The separate dry film photoresists may be formed separately and then placed onto the semiconductor substrate before being patterned. Once patterned, openings through the photoresist may have a tapered sidewall, allowing for a better coverage of the seed layer and a more uniform process to form conductive materials through the photoresist.
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