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FormFactor

FormFactor

FormFactor is a Livermore, California-based semiconductor company founded in 1993 by Igor Khandros.

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Edits on 5 May, 2023
"Covert AngelList URL to Wellfound ID"
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Golden AI
edited on 5 May, 2023
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Wellfound ID
formfactor
Edits on 28 Sep, 2022
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Arjun Singh
edited on 28 Sep, 2022
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Previous Name
High Precision Devices (HPD)
Edits on 18 Aug, 2022
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Bhupendra Solanki
edited on 18 Aug, 2022
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Date Incorporated
June 5, 1995
Key People
Michael D. Slessor
Michael D. Slessor
"update inverses"
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Golden AI
edited on 18 Aug, 2022
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Products
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HFTAP Series
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Golden AI
edited on 18 Aug, 2022
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Products
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InfinityXT Probe
"update inverses"
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Golden AI
edited on 18 Aug, 2022
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Products
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MPS150
Edits on 16 Aug, 2022
Войдило Артур Игоревич profile picture
Войдило Артур Игоревич
edited on 16 Aug, 2022
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Infobox (+1 properties)
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B2X
B2B
B2B
Edits on 10 Jun, 2022
"Entity importer update"
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Golden AI
edited on 10 Jun, 2022
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Is a
Organization
Organization
Edits on 29 May, 2022
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Patrick Pum
edited on 29 May, 2022
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Key people
NAICS code
334,413
CAGE code
7PFN1
Contact page URL
https://www.formfactor.com/sales-service/contact-sales/
Edits on 26 May, 2022
"Edit from table cell"
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Ольга Дрокина
edited on 26 May, 2022
Edits on 6 Apr, 2022
"Patent autocalculation"
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Golden AI
edited on 6 Apr, 2022
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CEO
Michael D. Slessor
Michael D. Slessor
CFO
Shai Shahar
Shai Shahar
Company status
Active
Founder
Igor Khandros
Igor Khandros
Key people
Number of Employees (ranges)
1,000 – 4,999
Number of employees
5,000
Patents assigned (count)
295
Edits on 14 Dec, 2021
"Remove inverse infobox"
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Golden AI
edited on 14 Dec, 2021
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Infobox (-213 properties)
Infobox
Patents
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US Patent 11131709 Probe systems for optically probing a device under test and methods of operating the probe systems
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US Patent 11156637 Electrical test probes having decoupled electrical and mechanical design
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US Patent 11156640 MEMS probe card assembly having decoupled electrical and mechanical probe connections
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US Patent 7086149 Method of making a contact structure with a distinctly formed tip structure
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US Patent 7092902 Automated system for designing and testing a probe card
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US Patent 7108546 High density planar electrical interface
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US Patent 7109736 System for measuring signal path resistance for an integrated circuit tester interconnect structure
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US Patent 7116119 Probe card with coplanar daughter card
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US Patent 7119564 Method and system for compensating thermally induced motion of probe cards
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US Patent 7122760 Using electric discharge machining to manufacture probes
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US Patent 7127811 Methods of fabricating and using shaped springs
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US Patent 7128587 Probe card covering system and method
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US Patent 7131848 Helical microelectronic contact and method for fabricating same
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US Patent 7140883 Contact carriers (tiles) for populating larger substrates with spring contacts
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US Patent 7142000 Mounting spring elements on semiconductor devices, and wafer-level testing methodology
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US Patent 7154259 Isolation buffers with controlled equal time delays
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US Patent 7168160 Method for mounting and heating a plurality of microelectronic components
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US Patent 7168162 Method of manufacturing a probe card
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US Patent 7169646 Interconnect assemblies and methods
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US Patent 7179662 Semiconductor fuse covering
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US Patent 7189077 Lithographic type microelectronic spring structures with improved contours
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US Patent 7195503 Electrical contactor, especially wafer level contactor, using fluid pressure
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US Patent 7196531 Method of manufacturing a probe card
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US Patent 7200930 Probe for semiconductor devices
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US Patent 7202677 Socket for mating with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component
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US Patent 7202682 Composite motion probing
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US Patent 7202687 Systems and methods for wireless semiconductor device testing
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US Patent 7204008 Method of making an electronics module
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US Patent 7211155 Apparatuses and methods for cleaning test probes
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US Patent 7215131 Segmented contactor
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US Patent 7217580 Method for processing an integrated circuit
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US Patent 7218094 Wireless test system
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US Patent 7218127 Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component
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US Patent 7225538 Resilient contact structures formed and then attached to a substrate
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US Patent 7227371 High performance probe system
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US Patent 7230437 Mechanically reconfigurable vertical tester interface for IC probing
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US Patent 7238464 Photoresist formulation for high aspect ratio plating
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US Patent 7239159 Method and apparatus for verifying planarity in a probing system
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US Patent 7239220 Adjustable delay transmission line
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US Patent 7239971 Method and apparatus for calibrating communications channels
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US Patent 7245120 Predictive, adaptive power supply for an integrated circuit under test
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US Patent 7245134 Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probes
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US Patent 7245137 Test head assembly having paired contact structures
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US Patent 7245139 Tester channel to multiple IC terminals
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US Patent 7251884 Method to build robust mechanical structures on substrate surfaces
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US Patent 7253651 Remote test facility with wireless interface to local test facilities
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US Patent 7257796 Method of incorporating interconnect systems into an integrated circuit process flow
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US Patent 7262611 Apparatuses and methods for planarizing a semiconductor contactor
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US Patent 7262624 Bi-directional buffer for interfacing test system channel
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US Patent 7276922 Closed-grid bus architecture for wafer interconnect structure
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US Patent 7282933 Probe head arrays
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US Patent 7285968 Apparatus and method for managing thermally induced motion of a probe card assembly
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US Patent 7287322 Lithographic contact elements
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US Patent 7306849 Method and device to clean probes
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US Patent 7307433 Intelligent probe card architecture
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US Patent 7312618 Method and system for compensating thermally induced motion of probe cards
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US Patent 7325302 Method of forming an interconnection element
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US Patent 7326327 Rhodium electroplated structures and methods of making same
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US Patent 7330039 Method for making a socket to perform testing on integrated circuits
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US Patent 7335057 High density planar electrical interface
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US Patent 7342402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features
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US Patent 7342405 Apparatus for reducing power supply noise in an integrated circuit
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US Patent 7345493 Wafer-level burn-in and test
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US Patent 7347702 Contact carriers (tiles) for populating larger substrates with spring contacts
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US Patent 7352196 Probe card assembly and kit
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US Patent 7362092 Isolation buffers with controlled equal time delays
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US Patent 11181550 Probe systems and methods including electric contact detection
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US Patent 7368930 Adjustment mechanism
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US Patent 7371072 Spring interconnect structures
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US Patent 7384277 Reinforced contact elements
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US Patent 7385411 Method of designing a probe card apparatus with desired compliance characteristics
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US Patent 7388424 Apparatus for providing a high frequency loop back with a DC path for a parametric test
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US Patent 7396236 Wafer level interposer
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US Patent 7400157 Composite wiring structure having a wiring block and an insulating layer with electrical connections to probes
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US Patent 7414418 Method and apparatus for increasing operating frequency of a system for testing electronic devices
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US Patent 7433188 Electronic package with direct cooling of active electronic components
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US Patent 7435108 Variable width resilient conductive contact structures
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US Patent 7443181 High performance probe system
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US Patent 7444253 Air bridge structures and methods of making and using air bridge structures
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US Patent 7444623 Process and apparatus for adjusting traces
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US Patent 7453258 Method and apparatus for remotely buffering test channels
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US Patent 7455540 Electrical contactor, especially wafer level contactor, using fluid pressure
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US Patent 7458123 Apparatuses and methods for cleaning test probes
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US Patent 7458816 Shaped spring
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US Patent 7459795 Method to build a wirebond probe card in a many at a time fashion
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US Patent 7463043 Methods of probing an electronic device
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US Patent 7466157 Contactless interfacing of test signals with a device under test
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US Patent 7471078 Stiffener assembly for use with testing devices
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US Patent 7471094 Method and apparatus for adjusting a multi-substrate probe structure
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US Patent 7479792 Methods for making plated through holes usable as interconnection wire or probe attachments
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US Patent 7482822 Apparatus and method for limiting over travel in a probe card assembly
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US Patent 7486095 System for measuring signal path resistance for an integrated circuit tester interconnect structure
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US Patent 7488917 Electric discharge machining of a probe array
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US Patent 7498824 Method and apparatus for making a determination relating to resistance of probes
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US Patent 7498825 Probe card assembly with an interchangeable probe insert
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US Patent 7508227 Closed-grid bus architecture for wafer interconnect structure
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US Patent 7524194 Lithographic type microelectronic spring structures with improved contours
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US Patent 7525302 Method of estimating channel bandwidth from a time domain reflectometer (TDR) measurement using rise time and maximum slope
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US Patent 7528618 Extended probe tips
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US Patent 7534654 Socket for making with electronic component, particularly semiconductor device with spring packaging, for fixturing, testing, burning-in or operating such a component
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US Patent 7548055 Testing an electronic device using test data from a plurality of testers
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US Patent 7550842 Integrated circuit assembly
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US Patent 7553165 Spring interconnect structures
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US Patent 7555836 Method of making lithographic contact elements
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US Patent 7557592 Method of expanding tester drive and measurement capability
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US Patent 7557596 Test assembly including a test die for testing a semiconductor product die
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US Patent 7560941 Method and system for compensating thermally induced motion of probe cards
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US Patent 7560943 Alignment features in a probing device
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US Patent 7563559 Photoresist formulation for high aspect ratio plating
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US Patent 7578057 Method of fabricating segmented contactor
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US Patent 7579269 Microelectronic spring contact elements
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US Patent 7579847 Probe card cooling assembly with direct cooling of active electronic components
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US Patent 7579856 Probe structures with physically suspended electronic components
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US Patent 7583101 Probing structure with fine pitch probes
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US Patent 7586300 Isolation buffers with controlled equal time delays
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US Patent 7592821 Apparatus and method for managing thermally induced motion of a probe card assembly
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US Patent 7593872 Method and system for designing a probe card
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US Patent 7595629 Method and apparatus for calibrating and/or deskewing communications channels
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US Patent 7601039 Microelectronic contact structure and method of making same
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US Patent 7609080 Voltage fault detection and protection
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US Patent 7609082 System for measuring signal path resistance for an integrated circuit tester interconnect structure
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US Patent 7612630 Electromagnetically coupled interconnect system architecture
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US Patent 7613591 Remote test facility with wireless interface to local facilities
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US Patent 7616016 Probe card assembly and kit
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US Patent 7618281 Interconnect assemblies and methods
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US Patent 7621044 Method of manufacturing a resilient contact
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US Patent 7622935 Probe card assembly with a mechanically decoupled wiring substrate
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US Patent 7628620 Reinforced contact elements
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US Patent 7634849 Method of assembling and testing an electronics module
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US Patent 7642794 Method and system for compensating thermally induced motion of probe cards
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US Patent 7649366 Method and apparatus for switching tester resources
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US Patent 7649368 Wafer level interposer
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US Patent 7658831 Three dimensional microstructures and methods for making three dimensional microstructures
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US Patent 7659736 Mechanically reconfigurable vertical tester interface for IC probing
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US Patent 7671614 Apparatus and method for adjusting an orientation of probes
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US Patent 7674112 Resilient contact element and methods of fabrication
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US Patent 7675299 Method and apparatus for making a determination relating to resistance of probes
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US Patent 7675301 Electronic components with plurality of contoured microelectronic spring contacts
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US Patent 7675311 Wireless test system
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US Patent 7681309 Method for interconnecting an integrated circuit multiple die assembly
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US Patent 7683738 Adjustable delay transmission line
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US Patent 7688063 Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies
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US Patent 7688085 Contactor having a global spring structure and methods of making and using the contactor
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US Patent 7688090 Wafer-level burn-in and test
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US Patent 7692433 Sawing tile corners on probe card substrates
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US Patent 7694246 Test method for yielding a known good die
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US Patent 7699616 High density planar electrical interface
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US Patent 7701243 Electronic device testing using a probe tip having multiple contact features
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US Patent 7714235 Lithographically defined microelectronic contact structures
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US Patent 7714598 Contact carriers (tiles) for populating larger substrates with spring contacts
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US Patent 7714603 Predictive, adaptive power supply for an integrated circuit under test
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US Patent 7722371 Electrical contactor, especially wafer level contactor, using fluid pressure
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US Patent 7724004 Probing apparatus with guarded signal traces
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US Patent 7729878 Air bridge structures and methods of making and using air bridge structures
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US Patent 7731503 Carbon nanotube contact structures
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US Patent 7731546 Microelectronic contact structure
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US Patent 7732713 Method to build robust mechanical structures on substrate surfaces
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US Patent 7732975 Biased gap-closing actuator
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US Patent 7733106 Apparatus and method of testing singulated dies
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US Patent 7737709 Methods for planarizing a semiconductor contactor
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US Patent 7746089 Method and apparatus for indirect planarization
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US Patent 7746937 Efficient wired interface for differential signals
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US Patent 7764075 High performance probe system
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US Patent 7768777 Electronic package with direct cooling of active electronic components
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US Patent 7772863 Mechanical decoupling of a probe card assembly to improve thermal response
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US Patent 7782072 Single support structure probe group with staggered mounting pattern
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US Patent 7798822 Microelectronic contact structures
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US Patent 7808259 Component assembly and alignment
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US Patent 7814453 Process and apparatus for finding paths through a routing space
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US Patent 7821255 Test system with wireless communications
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US Patent 7825652 Method and apparatus for remotely buffering test channels
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US Patent 7825674 Probe card configuration for low mechanical flexural strength electrical routing substrates
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US Patent 7825675 Method and apparatus for providing active compliance in a probe card assembly
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US Patent 7834647 Alignment features in a probing device
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US Patent 7836587 Method of repairing a contactor apparatus
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US Patent 7841863 Spring interconnect structures
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US Patent 7843202 Apparatus for testing devices
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US Patent 7845072 Method and apparatus for adjusting a multi-substrate probe structure
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US Patent 7851794 Rotating contact element and methods of fabrication
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US Patent 7852094 Sharing resources in a system for testing semiconductor devices
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US Patent 7863915 Probe card cooling assembly with direct cooling of active electronic components
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US Patent 7868632 Composite motion probing
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US Patent 7880486 Method and apparatus for increasing operating frequency of a system for testing electronic devices
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US Patent 7880489 Printing of redistribution traces on electronic component
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US Patent 7884006 Method to build a wirebond probe card in a many at a time fashion
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US Patent 7884627 Stiffener assembly for use with testing devices
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US Patent 7888955 Method and apparatus for testing devices using serially controlled resources
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US Patent 7889022 Electromagnetically coupled interconnect system architecture
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US Patent 7893700 Configuration of shared tester channels to avoid electrical connections across die area boundary on a wafer
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US Patent 7893701 Method and apparatus for enhanced probe card architecture
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US Patent 7897435 Re-assembly process for MEMS structures
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US Patent 7898242 Probe card assembly with an interchangeable probe insert
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US Patent 7920989 Remote test facility with wireless interface to local test facilities
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US Patent 7924035 Probe card assembly for electronic device testing with DC test resource sharing
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US Patent 7928750 Contactless interfacing of test signals with a device under test
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US Patent 7930219 Method and system for designing a probe card
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US Patent 7936177 Providing an electrically conductive wall structure adjacent a contact structure of an electronic device
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US Patent 7944225 Method and apparatus for providing a tester integrated circuit for testing a semiconductor device under test
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US Patent 7948252 Multilayered probe card
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US Patent 7952375 AC coupled parameteric test probe
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US Patent 7956633 Stacked guard structures
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US Patent 7956635 Stiffener assembly for use with testing devices
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US Patent 7960989 Mechanical decoupling of a probe card assembly to improve thermal response
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US Patent 7960990 Closed-grid bus architecture for wafer interconnect structure
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US Patent 7965084 Self-monitoring switch
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US Patent 7967621 Electrical contactor, especially wafer level contactor, using fluid pressure
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US Patent 7977956 Method and apparatus for probe card alignment in a test system
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US Patent 7977958 Bi-directional buffer for interfacing test system channel
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US Patent 7977959 Method and apparatus for testing devices using serially controlled intelligent switches
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US Patent 7990164 Method of designing a probe card apparatus with desired compliance characteristics
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US Patent 7994803 Calibration substrate
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US Patent 7999375 Electronic device with integrated micromechanical contacts and cooling system
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US Patent 8011089 Method of repairing segmented contactor
Edits on 8 Dec, 2021
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Golden AI
edited on 8 Dec, 2021
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Patents
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US Patent 8011089 Method of repairing segmented contactor
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Golden AI
edited on 8 Dec, 2021
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Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patents
‌
US Patent 7994803 Calibration substrate
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Golden AI
edited on 8 Dec, 2021
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Golden AI
edited on 8 Dec, 2021
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Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patents
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US Patent 7977958 Bi-directional buffer for interfacing test system channel
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Golden AI
edited on 8 Dec, 2021
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edited on 8 Dec, 2021

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