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Richard A. Rosenberger

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Edits on 14 Dec, 2021
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edited on 14 Dec, 2021
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Patent primary examiner of
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US Patent 7092109 Position/orientation measurement method, and position/orientation measurement apparatus
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US Patent 7095497 Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatus
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US Patent 7099002 Defect detector and method of detecting defect
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US Patent 7102744 Process and assembly for non-destructive surface inspections
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US Patent 7106425 Methods and systems for determining a presence of defects and a thin film characteristic of a specimen
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US Patent 7106459 CD metrology analysis using a finite difference method
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US Patent 7113286 Apparatus and method for improved analysis of liquids by continuous wave-cavity ring down spectroscopy
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US Patent 7116422 Wavelength modulation spectroscopy method and system
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US Patent 7119912 Ranging sensor and electronic device using the same
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US Patent 7126677 Bearing with oil film thickness measuring device
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US Patent 7126699 Systems and methods for multi-dimensional metrology and/or inspection of a specimen
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US Patent 7126700 Parametric optimization of optical metrology model
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US Patent 7130029 Methods and systems for determining an adhesion characteristic and a thickness of a specimen
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US Patent 7130036 Methods and systems for inspection of an entire wafer surface using multiple detection channels
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US Patent 7130039 Simultaneous multi-spot inspection and imaging
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US Patent 7139083 Methods and systems for determining a composition and a thickness of a specimen
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US Patent 7142307 Method and apparatus for optical interactance and transmittance measurements
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US Patent 7148968 Portable surface plasmon resonance imaging instrument
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US Patent 7151597 Optical wavelength standard and optical wavelength calibration system and method
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US Patent 7161667 Wafer edge inspection
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US Patent 7161668 Wafer edge inspection
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US Patent 7161669 Wafer edge inspection
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US Patent 7161688 Mass scanning and dimensioning system
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US Patent 7167248 Reflection-type optical sensor, carriage, and data processing device
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US Patent 7173708 Method and apparatus for detecting damage in plant products
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US Patent 7177018 Multiplex illuminator and device reader for microcantilever array
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US Patent 7180586 System for detection of wafer defects
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US Patent 7184134 Real-time monitoring apparatus for plasma process
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US Patent 7187439 High throughput inspection system and method for generating transmitted and/or reflected images
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US Patent 7187441 Particle analysis system and method
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US Patent 7190440 Controlling compressive force using pressure sensitive film
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US Patent 7190460 Focusing optics for small spot optical metrology
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US Patent 7193696 Systems and methods for using light to indicate defect locations on a composite structure
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US Patent 7193700 Apparatus for monitoring the functionality of an optical element
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US Patent 7196782 Methods and systems for determining a thin film characteristic and an electrical property of a specimen
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US Patent 7199874 Darkfield inspection system having a programmable light selection array
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US Patent 7199880 Method and apparatus for optically scanning a vehicle wheel
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US Patent 7202945 Device and method for analyzing samples
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US Patent 7209227 Backside contamination inspection device
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US Patent 7212288 Position modulated optical reflectance measurement system for semiconductor metrology
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US Patent 7215428 Absorption spectroscopy apparatus and method
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US Patent 7220387 Disposable sensor for use in measuring an analyte in a gaseous sample
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US Patent 7227642 Absorbance monitor
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US Patent 7233401 Method and apparatus for measuring thickness of a material
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US Patent 7236248 Optical phytoplankton discriminator
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US Patent 7239399 Pick and place machine with component placement inspection
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US Patent 7248375 Critical dimension analysis with simultaneous multiple angle of incidence measurements
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US Patent 7253892 Method and apparatus for measuring a characteristic of a plastic container
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US Patent 7253909 Phase shift measurement using transmittance spectra
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US Patent 7256879 Semiconductor array tester
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US Patent 7256897 Three-dimensional measurement apparatus and three-dimensional measurement method
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US Patent 7259841 Security reader for automatic detection of tampering and alteration
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US Patent 7259855 Porous microsphere resonators
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US Patent 7259857 Methods for automated uniformity assessment and modification of image non-uniformities
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US Patent 7259858 Imaging apparatus having media sensing system
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US Patent 7262851 Method and apparatus for detecting relative positional deviation between two objects
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US Patent 7265845 Surface corrugation enhanced magneto-optical indicator film
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US Patent 7268866 Method for inspecting a weld seam in a workpiece made of weldable plastic and device for carrying out this method
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US Patent 7270442 System and method for monitoring status of a visual signal device
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US Patent 7271919 Confocal displacement sensor
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US Patent 7274470 Optical 3D digitizer with enlarged no-ambiguity zone
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US Patent 7274471 Systems and methods for measuring distance of semiconductor patterns
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US Patent 7277163 Personal identification system
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US Patent 7277177 System and method for controlling a light source for cavity ring-down spectroscopy
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US Patent 7280197 Wafer edge inspection apparatus
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US Patent 7280215 Photothermal system with spectroscopic pump and probe
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US Patent 7286210 Passive optical sensor using carbon nanotubes
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US Patent 7286235 Long-range surface plasmon resonance device utilizing nano-scale porous dielectric and method of fabricating the same
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US Patent 7289202 Methods for testing durable optical elements
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US Patent 7295294 Optical waveguide sensor and measuring apparatus using said optical waveguide sensor, and measuring method using a sensor
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US Patent 7301640 System and method of condensation reduction in an electrical unit
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US Patent 7304731 Systems and methods for providing illumination of a specimen for inspection
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US Patent 7359056 Enhanced signal detection of optically encoded particles via flare
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US Patent 7362422 Method and apparatus for a downhole spectrometer based on electronically tunable optical filters
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US Patent 7379175 Methods and systems for reticle inspection and defect review using aerial imaging
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US Patent 7382471 Non-contact apparatus and method for measuring surface profile
Edits on 30 Nov, 2021
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edited on 30 Nov, 2021
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Infobox
Patent primary examiner of
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US Patent 7382471 Non-contact apparatus and method for measuring surface profile
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edited on 29 Nov, 2021
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Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7379175 Methods and systems for reticle inspection and defect review using aerial imaging
Edits on 25 Nov, 2021
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edited on 25 Nov, 2021
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Golden AI
edited on 25 Nov, 2021
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Infobox
Patent primary examiner of
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US Patent 7359056 Enhanced signal detection of optically encoded particles via flare
Edits on 23 Nov, 2021
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Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7304731 Systems and methods for providing illumination of a specimen for inspection
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Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7301640 System and method of condensation reduction in an electrical unit
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Golden AI
edited on 23 Nov, 2021
Golden AI profile picture
Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7289202 Methods for testing durable optical elements
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Golden AI
edited on 23 Nov, 2021
Golden AI profile picture
Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7286210 Passive optical sensor using carbon nanotubes
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Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7280215 Photothermal system with spectroscopic pump and probe
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Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7280197 Wafer edge inspection apparatus
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Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7277163 Personal identification system
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Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7277177 System and method for controlling a light source for cavity ring-down spectroscopy
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Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7274470 Optical 3D digitizer with enlarged no-ambiguity zone
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Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7274471 Systems and methods for measuring distance of semiconductor patterns
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Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7271919 Confocal displacement sensor
Golden AI profile picture
Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7270442 System and method for monitoring status of a visual signal device
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Golden AI
edited on 22 Nov, 2021

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