Patent 10121551 was granted and assigned to Micron Technology on November, 2018 by the United States Patent and Trademark Office.
Devices and techniques for detecting power loss in NAND memory devices are disclosed herein. A memory controller may calibrate a first read level for a first physical page of a number of physical pages from an initial first read level position to a calibrated first read level position. The first read level may be between a first threshold voltage distribution corresponding to a first logical state of the at least four logical states and a second threshold voltage distribution corresponding to a second logical state of the at least four logical states. Also, the first threshold voltage distribution may be a highest threshold voltage distribution for the first physical page. The memory controller may calibrate a second read level for the first physical page that is lower than the first read level from an initial second read level position to a calibrated first read level position. The memory controller may determine to refresh at least one logical page stored at the first physical page based at least in part on a first read level difference between the initial first read level and the calibrated first read level and a second read level difference between the initial second read level and the calibrated second read level.