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US Patent 11075058 Spatially variable wafer bias power system

Patent 11075058 was granted and assigned to Eagle Harbor Technologies, Inc. on July, 2021 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
Eagle Harbor Technologies, Inc.
Eagle Harbor Technologies, Inc.
Current Assignee
Eagle Harbor Technologies, Inc.
Eagle Harbor Technologies, Inc.
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11075058
Date of Patent
July 27, 2021
Patent Application Number
16721396
Date Filed
December 19, 2019
Patent Citations
‌
US Patent 10460910 High voltage resistive output stage circuit
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US Patent 10659019 Nanosecond pulser ADC system
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US Patent 10301587 Compact subnanosecond high voltage pulse generation system for cell electro-manipulation
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US Patent 10020800 High voltage nanosecond pulser with variable pulse width and pulse repetition frequency
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US Patent 10304661 Arbitarary waveform generation using nanosecond pulses
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US Patent 10373804 System for tunable workpiece biasing in a plasma reactor
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US Patent 10382022 High voltage nanosecond pulser with variable pulse width and pulse repetition frequency
Patent Citations Received
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US Patent 12111341 In-situ electric field detection method and apparatus
0
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US Patent 11462389 Pulsed-voltage hardware assembly for use in a plasma processing system
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US Patent 11476090 Voltage pulse time-domain multiplexing
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US Patent 11476145 Automatic ESC bias compensation when using pulsed DC bias
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US Patent 11495470 Method of enhancing etching selectivity using a pulsed plasma
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US Patent 11508554 High voltage filter assembly
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US Patent 11569066 Pulsed voltage source for plasma processing applications
0
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Patent Primary Examiner
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Dharti H Patel
Patent abstract

A plasma deposition system comprising a wafer platform, a second electrode, a first electrode, a first high voltage pulser, and a second high voltage pulser. In some embodiments, the second electrode may be disposed proximate with the wafer platform. In some embodiments, the second electrode can include a disc shape with a central aperture; a central axis, an aperture diameter, and an outer diameter. In some embodiments, the first electrode may be disposed proximate with the wafer platform and within the central aperture of the second electrode. In some embodiments, the first electrode can include a disc shape, a central axis, and an outer diameter. In some embodiments, the first high voltage pulser can be electrically coupled with the first electrode. In some embodiments, the second high voltage pulser can be electrically coupled with the second electrode.

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