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US Patent 11245036 Latch-up prevention
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Patent
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Date Filed
July 21, 2020
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Date of Patent
February 8, 2022
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Patent Application Number
16935000
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Patent Citations
US Patent 10157799 Multi-gate device and method of fabrication thereof
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US Patent 10199502 Structure of S/D contact and method of making same
US Patent 10325820 Source and drain isolation for CMOS nanosheet with one block mask
US Patent 10290546 Threshold voltage adjustment for a gate-all-around semiconductor structure
US Patent 10475902 Spacers for nanowire-based integrated circuit device and method of fabricating same
US Patent 10032627 Method for forming stacked nanowire transistors
US Patent 10109721 Horizontal gate-all-around device having wrapped-around source and drain
Patent Citations Received
US Patent 12062721 Latch-up prevention
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Patent Inventor Names
Kuo-Cheng Chiang
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Shih-Cheng Chen
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Zhi-Chang Lin
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11245036
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Patent Primary Examiner
Tong-Ho Kim
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