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US Patent 11374088 Leakage reduction in gate-all-around devices
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Patent
Date Filed
August 14, 2020
Date of Patent
June 28, 2022
Patent Application Number
16994274
Patent Citations
US Patent 10314154 System and method for extreme ultraviolet source control
0
US Patent 10050045 SRAM cell with balanced write port
Patent Citations Received
US Patent 11784226 Semiconductor gate-all-around device having an anti-punch-through (APT) layer including carbon
Patent Inventor Names
Jhon Jhy Liaw
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11374088
Patent Primary Examiner
Farun Lu
CPC Code
H01L 29/0638
H01L 2029/7858
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