Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
June 6, 2023
0Patent Application Number
172238490
Date Filed
April 6, 2021
0Patent Citations
Patent Primary Examiner
An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
