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US Patent 11781965 System and method for particles measurement

Patent 11781965 was granted and assigned to Particle Measuring Systems on October, 2023 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
‌
Particle Measuring Systems
Date Filed
October 25, 2018
Date of Patent
October 10, 2023
Patent Applicant
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Particle Measuring Systems
Patent Application Number
16652653
Patent Citations
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US Patent RE39783 Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems
‌
US Patent 7456960 Particle counter with improved image sensor array
‌
US Patent 7526158 System and method for high resolution optical imaging, data storage, lithography, and inspection
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US Patent 7528959 Apparatus and method for sizing nanoparticles based on interferometric field detection
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US Patent 7561267 Flow cytometer
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US Patent 7576857 Particle counter with laser diode
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US Patent 7630147 Laser beam shaping for pitchfork profile
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US Patent 7088446 Optical measurement of the chemical constituents of an opaque slurry
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US Patent 7088447 Particle counter with self-concealing aperture assembly
‌
US Patent 7092078 Flow cytometer for classifying leukocytes and method for determining detection angle range of the same
•••
Patent Inventor Names
Mehran Vahdani Moghaddam
Nir Karasikov
Ori Weinstein
Shoam Shwartz
Uri Dubin
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11781965
Patent Primary Examiner
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Rebecca C Bryant
CPC Code
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G01N 2015/1075
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G01N 15/1459
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G01N 15/1434

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