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US Patent 7456960 Particle counter with improved image sensor array

Patent 7456960 was granted and assigned to Particle Measuring Systems on November, 2008 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Current Assignee
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Particle Measuring Systems
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
74569600
Patent Inventor Names
Dwight A. Sehler0
Todd A. Cerni0
Date of Patent
November 25, 2008
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Patent Application Number
112738650
Date Filed
November 15, 2005
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Patent Citations Received
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US Patent 12130222 Condensation particle counters and methods of use
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US Patent 11946852 Particle detection systems and methods for on-axis particle detection and/or differential detection
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US Patent 11988591 Modular optical particle counter sensor and apparatus
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US Patent 11988593 Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions
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US Patent 11703443 Flow cytometer
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US Patent 11781965 System and method for particles measurement
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Patent Primary Examiner
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Tarifur R Chowdhury
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Patent abstract

A particle counter for optically detecting an unconstrained particle of less than one micron in size suspended in a flowing liquid includes a sample chamber having a fluid inlet and a fluid outlet; a laser module producing a laser beam; a beam shaping optical system providing a multiple laser beam pattern in the sample chamber, and a CMOS optical detector located to detect light scattered by the particles in the sample chamber. The particle counter has a particle sensing area within the sample chamber in which the intensity of light is at least 10 Watts/mm2, the sensing area having an area of 0.5 square mm or more. The detector has thirty or more detector array elements. In the preferred embodiment, the laser optical system reflects and refocuses the laser beam to effect multiple passes of the same laser beam through the sensing area.

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