Is a
Patent attributes
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Chueh-Chi Kuo0
Po-Chung Cheng0
Li-Jui Chen0
Che-Chang Hsu0
Tzung-Chi Fu0
Tsung-Yen Lee0
Hsiao-Lun Chang0
Date of Patent
May 14, 2024
0Patent Application Number
183262100
Date Filed
May 31, 2023
0Patent Citations
...
Patent Primary Examiner
CPC Code
Patent abstract
A method of lithography process is provided. The method includes forming a conductive layer over a reticle. The method includes applying ionized particles to the reticle by a discharging device. The method includes forming a photoresist layer over a semiconductor substrate. The method includes securing the semiconductor substrate by a wafer electrostatic-clamp. The method also includes patterning the photoresist layer by emitting radiation from a radiation source via the reticle.
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