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US Patent 12131998 Integrated circuit, system and method of forming same

Patent 12131998 was granted and assigned to Taiwan Semiconductor Manufacturing Company on October, 2024 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Current Assignee
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
121319980
Patent Inventor Names
Shih-Wei Peng0
Wei-Cheng Lin0
Jiann-Tyng Tzeng0
Kam-Tou Sio0
Te-Hsin Chiu0
Date of Patent
October 29, 2024
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Patent Application Number
182981720
Date Filed
April 10, 2023
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Patent Citations
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US Patent 7260442 Method and system for mask fabrication process control
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US Patent 9256709 Method for integrated circuit mask patterning
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Patent Primary Examiner
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Chuong A Luu
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CPC Code
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H01L 21/823475
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H01L 21/823871
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H01L 23/48
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H01L 23/50
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H01L 23/481
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H01L 23/522
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H01L 23/525
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H01L 23/528
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Patent abstract

A method of fabricating an integrated circuit includes fabricating a set of transistors in a front-side of a substrate, fabricating a first set of vias in a back-side of the substrate, depositing a first set of conductive structures on the back-side on a first level, depositing a second set of conductive structures on the back-side on a second level thereby forming a set of power rails, fabricating a second set of vias in the back-side, and depositing a third set of conductive structures on the back-side on a third level. The first set of vias is electrically coupled to the set of transistors. The second set of vias is electrically coupled to the first and third set of conductive structures. A first structure of the first set of conductive structures is electrically coupled to a first via of the first set of vias.

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