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US Patent 9256709 Method for integrated circuit mask patterning

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Is a
Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
9256709
Date of Patent
February 9, 2016
Patent Application Number
14180233
Date Filed
February 13, 2014
Patent Citations Received
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US Patent 12135930 Integrated circuit layout generation method and system
0
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US Patent 12125840 Non-transitory computer-readable medium, integrated circuit device and method
0
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US Patent 12131998 Integrated circuit, system and method of forming same
0
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US Patent 12137548 Four CPP wide memory cell with buried power grid, and method of fabricating same
0
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US Patent 11704469 Integrated circuit and method of forming the same
0
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US Patent 11715546 Memory array test method and system
0
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US Patent 11715733 Integrated circuit device and method
0
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US Patent 11748550 Integrated circuit with constrained metal line arrangement
...
Patent Primary Examiner
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Naum B Levin
Patent abstract

Provided is a method of transforming an integrated circuit (IC) pattern into one or more patterns suitable for subsequent processing, such as mask fabrication. The method includes receiving an IC pattern that has an arbitrary shape, and using a computer, deriving an approximation IC pattern, wherein the approximation IC pattern is in a shape that is a user-defined fabrication-friendly shape, such as a rectangle or an ellipse. The method further includes calculating a pattern approximation error between the IC pattern and the approximation IC pattern. The method further includes checking whether the pattern approximation error is less than a user-defined threshold. If it is, the method further includes outputting the approximation IC pattern for subsequent fabrication. Otherwise, the method further includes splitting the IC pattern into a plurality of subparts, and recursively transforming each of the plurality of subparts.

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