US Patent 7649200 System and method of detecting IC die cracks
Patent 7649200 was granted and assigned to Advanced Micro Devices on January, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
May 19, 2005
0
Date of Patent
January 19, 2010
0
Patent Application Number
11133108
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Patent Inventor Names
Seth J. Prejean
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Roy Mark Miller
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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