US Patent 8785883 Transmission electron microscope, and method of observing specimen

Patent 8785883 was granted and assigned to Hitachi on July, 2014 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Current Assignee

Hitachi

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

87858830

Patent Inventor Names

Eiko Nakazawa0

Hiroyuki Kobayashi0

Susumu Kuwabata0

Date of Patent

July 22, 2014

Patent Application Number

129186190

Date Filed

April 27, 2009

Patent Citations Received

‌

US Patent 12024705 Methods and systems for screening using microcapillary arrays

Patent Primary Examiner

‌

Nicole Ippolito

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