US Patent 8785883 Transmission electron microscope, and method of observing specimen
Patent 8785883 was granted and assigned to Hitachi on July, 2014 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
April 27, 2009
0
Date of Patent
July 22, 2014
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Patent Application Number
12918619
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Patent Citations Received
Patent Inventor Names
Eiko Nakazawa
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Hiroyuki Kobayashi
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Susumu Kuwabata
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Patent Jurisdiction
Patent Number
Patent Primary Examiner
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